Modeling Depth Resolved XRF data to study Semiconductor-Oxide Thin Films doped with transition metals ions

نویسندگان

  • C. Torres
  • S. O. Ferreira
  • C. A. Pérez
چکیده

Grazing Incidence X-Ray Fluorescence (GI-XRF) technique is a powerful tool for the characterization of depth profile concentrations in multilayered samples. A modeling program called ANDEN has been developed for simulating GI-XRF data for layered thin films [1]. ANDEN was used as one of the tools to study the dependence of dopants distribution with magnetic behavior in Diluted Magnetic Semiconductors (DMS). These new kind of materials attract attention because of their potential applications in spintronics, once they showed ferromagnetic properties at room temperature [2]. Codoped TiO2 and SnO2 thin films were grown on Si, LaAlO3 (LAO) and SrTiO3 (STO) substrates using both DC/RF Sputtering and Pulsed Laser Deposition (PLD). Combined GI-XRF and X-ray Reflectivity (XRR) were used to study cobalt depth profile within the films. In addition, magnetic properties of these films were also studied using complementary techniques such as superconducting quantum interference device (SQUID) and X-ray Magnetic Circular Dichroism (XMCD). GIXRF, XRR and XMCD measurements were performed at the Brazilian Synchrotron Light Laboratory in Campinas, Brazil. In this work, an overall description of the ANDEN program as well as the main results about the behavior of Co in semiconductor oxide thin film, will be given.

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تاریخ انتشار 2015